TITLE: A Composition-Aware Model For Unreliable Circuits


PUBLICATION/VENUE: 2010 53rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2010, pp. 853-856.


As the integrated circuit geometries shrink, it becomes important for the designers to take into consideration the reliability of the circuits. Different techniques can be used for reliability calculation or estimation. Some of the techniques are accurate but time-consuming while others are quick but may not be accurate enough. This work presents a model for calculating reliability (represented by probability of failure) as a function of circuit composition, such as, number of inputs and numbers of different types of gates, etc. The model is based on data collected from the simulations of a large number of combinational circuits.


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